Cd Dopant Effect on Structural and Optoelectronic Properties of TiO2 Solar Detectors

dc.contributor.author Ilhan, Mustafa
dc.contributor.author Koc, Mumin Mehmet
dc.contributor.author Coskun, Burhan
dc.contributor.author Erkovan, Mustafa
dc.contributor.author Yakuphanoglu, Fahrettin
dc.date.accessioned 2021-03-15T13:06:10Z
dc.date.available 2021-03-15T13:06:10Z
dc.date.issued 2021
dc.description Koc, Mumin Mehmet/0000-0003-4500-0373; Erkovan, Mustafa/0000-0002-4527-2056 en_US
dc.description.abstract Al/n-Si/Ti1-xO2CdxO/Al photodiodes were produced using sol-gel and spin coating methods where CdO dopant was applied on different concentrations (x = 0.0; x = 0.01; x = 0.05; x = 0.10). Cd dopant effect upon structural, optical, photodiode and electrical properties was assessed. Scanning electron microscope and energy-dispersive spectra were used in the structural investigation. Optic properties were assessed using UV-Vis spectroscopy and bandgap energies of the photodiodes were calculated which were found to be between 3.25 and 3.36 eV. Increased bandgap energy was observed with increased CdO doping rate. Photodiode properties were assessed under varying daylight illuminations. Barrier height, ideality factor, dark current, linear dynamic rate, photosensitivity, photoresponsivity of the photodiodes were calculated. Electrical properties of the Al/n-Si/Ti1-xO2CdxO/Al photodiodes were calculated where conductance-voltage and capacitance-voltage plots were obtained. Corrective conductance-voltage and corrective capacitance-voltage graphs confirm that the electrical properties of the photodiodes depend on AC signal frequency. Frequency-dependent electrical characteristics were attributed to the density of interface states which were found to be between 10(11) and 10(12). Decreased density of interface state was found for increased AC signal frequency. en_US
dc.identifier.doi 10.1007/s10854-020-05000-3
dc.identifier.issn 0957-4522
dc.identifier.issn 0957-4522
dc.identifier.issn 1573-482X
dc.identifier.scopus 2-s2.0-85098527192
dc.identifier.uri https://doi.org/10.1007/s10854-020-05000-3
dc.language.iso en en_US
dc.publisher Springer en_US
dc.relation.ispartof Journal of Materials Science-Materials in Electronics en_US
dc.rights info:eu-repo/semantics/closedAccess en_US
dc.title Cd Dopant Effect on Structural and Optoelectronic Properties of TiO2 Solar Detectors en_US
dc.type Article en_US
dspace.entity.type Publication
gdc.author.id Koc, Mumin Mehmet/0000-0003-4500-0373
gdc.author.id Erkovan, Mustafa/0000-0002-4527-2056
gdc.author.institutional Erkovan, Mustafa
gdc.author.scopusid 59794689600
gdc.author.scopusid 57195402035
gdc.author.scopusid 36113105900
gdc.author.scopusid 36460853400
gdc.author.scopusid 56247755900
gdc.author.wosid Yakuphanoglu, Fahrettin/C-8365-2012
gdc.author.wosid Coskun, Burhan/Jco-5169-2023
gdc.author.wosid Koc, Mumin Mehmet/Aaf-9492-2019
gdc.author.wosid Erkovan, Mustafa/Aac-2014-2021
gdc.description.department Beykoz Üniversitesi Muhendislik ve Mimarlik Fakultesi
gdc.description.department Beykoz University en_US
gdc.description.departmenttemp [Ilhan, Mustafa; Yakuphanoglu, Fahrettin] Firat Univ, Fac Sci & Literature, Dept Phys, Elazig, Turkey; [Koc, Mumin Mehmet] Kirklareli Univ, Sch Hlth Serv, Dept Hlth Serv, Kirklareli, Turkey; [Koc, Mumin Mehmet; Coskun, Burhan] Kirklareli Univ, Fac Sci & Literature, Dept Phys, Kirklareli, Turkey; [Erkovan, Mustafa] INESC Microsyst & Nanotechnol, Lisbon, Portugal; [Erkovan, Mustafa] Beykoz Univ, Dept Comp Engn, Istanbul, Turkey en_US
gdc.description.endpage 2365 en_US
gdc.description.issue 2 en_US
gdc.description.publicationcategory Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı en_US
gdc.description.scopusquality Q2
gdc.description.startpage 2346 en_US
gdc.description.volume 32 en_US
gdc.description.woscitationindex Science Citation Index Expanded
gdc.description.wosquality Q2
gdc.identifier.wos WOS:000604333400040
gdc.index.type WoS
gdc.index.type Scopus
gdc.relation.journal Journal of Materials Science-Materials In Electronics en_US

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